Product information

T8200Shannon [Equipment for mass production]

T9300 製品紹介
Now capable of high-speed (0.15 sec) inspection in the RFID manufacturing process!
 The T8200Shannon is a testing system designed for mass production that measures the resonance frequency and Q-factor of IC cards and tags.
It supports simultaneous testing on up to 32 channels.
It is a proven testing solution adopted by RFID manufacturing facilities both in Japan and overseas.
T8200Shannon製品画像
T8200Shannon装置あり製品画像

Features

T8200Shannon特徴リスト
  • Supports simultaneous measurement of 2 to 32 channels

    Multi-channel simultaneous measurement enables the high throughput required in mass production environments.

  • High-speed measurement (just 0.15 seconds per measurement)

    It offers high-speed processing performance that is ideal for 100% inspection of sheet-fed and roll-fed products.

  • I/O Output for Production Line Integration

    PASS/FAIL results for channels 1–32 are output via I/O, enabling integration with automated equipment.

  • Compatible with custom inspection heads

    We can custom-manufacture products tailored to the design of the coil being measured. These are also ideal for integration into production equipment.

  • Supporting Consistent Quality in IC Cards and RFID Tags

    High-precision measurements ensure consistent quality in our final inspections.

T8200Shannon Video

製品紹介

The video above was filmed by our company.
If you are considering purchasing this tester or would like to request a demonstration, please feel free to contact us.

T8200Shannon製品画像

Test Screen and Log Screen

Inspection screen
Inspection log screen
Specification
Measurements
Amplitude of Transmission or reflection voltage)
Test items
Resonance Frequency, Damping, Q-Factor, and Damping Limit Tests
(Optional: Communication) Reading of UID/PUPI/IDm
Protocols Supporting UID Reading
Note 1)
ISO14443TypeA（MIFARE Classic, MIFARE Ultralight）：UID
ISO14443TypeB：PUPI
Felica：IDm
ISO15693（Tag it HF-I Plus/Pro, I・CODE SLIX2）：UID
Number of measurement points
100～2048points
Test time　
Note2)
0.15sec(typ)
(Measurement points 500 points, Averaging 4 times)
Test Result Storage Function
Note 3)
Test log file(csv)：
・Aggregation by production lot
Lot start、End time、PASS/FAIL, resonant frequency , attenuation, Q(quality factor)
Frequency Range
1MHz～100 MHz
RF Power(＠50Ωload)
-30～+15 dBm
Operation Mode
PC connect Mode
　・Manual control
　・Digital IO(DIO)
Standalone Mode
　・Digital IO(DIO)
DIO interface Typical characteristics
Isolated(photocoupler)terminal
Output terminal：VCC=24V, Iout < 20 mA, Residual voltage < 1 V
DIO interface Typical Characteristics
(Option: DIO)
Input ：forward current: 50mA、reverse voltage:6V
Output：forward voltage: 40V、reverse voltage: 6V、sink current 80mA、 power dissipation 100mW/Ch
System Requirement
OS：Windows 10,11
USB2.0 or higher
Power Supply
DC5V±5%(Current consumption less than 1A)
Power connector shape: DC Power Jack (2.0mm)pin
Supplied Accessories
Coaxial cable (1 m × 4), AC adapter, DIO connector, USB-RS485 conversion cable (input AC 100-240 V 50/60 Hz 0.3 A, output DC 5 V 2.0 A), COM cable, short plug (2), USB Memory.
Dimensions(excludingprotrusions), weight
1-slot housing: 170mm(W)×165mm(D)×39mm(H) approx. 0.6㎏
8-slot housing: 360mm(W)×205mm(D)×180mm(H) approx. 3.5㎏
Body：approx. 0.3㎏
Guaranteed Operating Environment
5°C to 35°C (within ±3°C of the temperature at the time of calibration)
warm-up time
30 min.
Note 1) This device is not an RFID reader/writer. It is not intended to evaluate the communication performance of
the test subject.Depending on the test subject, the ID may not be readable.
Note 2) Test duration depends on the PC being used, the test settings of this device, and the characteristics of the test
subject.
Note 3) Test logs are saved only when in PC-linked mode.
*Specifications and appearance are subject to change without notice.